On defects, they've got proven around the micron scale they insert no new defects into the layer transferred towards the SmartSiC, even so potential perform to extend that to the total wafer would provide certainty with the macro trend. The opportunity for independent validation of such substrates would allay any https://www.facebook.com/permalink.php?story_fbid=pfbid0k1KKtM8LnFWgKEEWFhKXhUuLmUtbf29WLcepAsUZrDDB2FdSpv1KwS4tQW3y1gV9l&id=61562415773754&__cft__[0]=AZWz5cBkQO5gh9Y2ZKzb_0y9IZQeh2xCmfwNKs5bPjJE86ti_gEJAvnmMo2VXQMhk773e7VMB9lfP7A-HtjqcHcXV-08I3B7p9LgHowPaCwAL4XtEMfvRwv41cem2N84MIv-WZZde6n340QQa8Qh5rbKgZmwdR3FFwmhmlQ8I3DKWM-R2SLlUdVJFoMtnOOMSG2ndMD-9o_ylG80l4_Bsbhz&__tn__=%2CO%2CP-R